Lumetrics gains CE certificatification

23 October 2006


US manufacturer of non contact thickness measurement systems Lumetrics has received CE technical approval for the its OptiGauge system. The company has also formed a strategic sales partnerships with 2Spring, a technical sales and marketing group in The Netherlands.

The OptiGauge system uses a non contact infra red optical approach to measure single and multiple layer films and components simultaneously. Based on technology originally developed by Eastman Kodak, it can be used on the manufacturing line, in the QA lab, or both.

The system can gauge multiple layers ranging from 12 micron to 8mm thick at up to 200Hz scan rate. Eight OptiGauge probes can be multiplexed on a single system to maximize efficiency and minimize cost.



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